Fast Aquisition of 3D deformation and thickness changes in 2D tensile stress tests of plastics in cooperation with Institute of Applied Mechanics for extraction of mechanic parameters.
The current photogammetric measurement methode requires elaborate surface treatment and does not provide the necessary accuray.
Methods/Results
Measurement of the out-of-plane deformation in the nanometer regime by phase-shifting electronic speckle-pattern interferometry (ESPI). In combination with in-plane speckle pattern correlation technique the reconstruction of the 3D deformation is enabled.
Fast phase shifting by wavelength tuning via injection current of a laser diode.
Our website uses cookies. These have two functions: Firstly, they are necessary for the basic functionality of our website. On the other hand, with the help of cookies, we can continually improve our content for you. For this purpose, pseudonymised data of website visitors is collected and analysed. By clicking on Settings, you can also select the individual cookies you wish to accept. You can revoke your consent to the use of cookies at any time, even partially. You can find more information about cookies on this website in our privacy declaration and about us in the imprint.
